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基于双光源法的直裂纹深度定量检测数值模拟研究

Numerical Simulation of Quantitative Detection of Straight Crack Depth Based on Dual Light Source Method

  • 摘要: 围绕表面裂纹的深度检测,采用数值模拟方法对比了双光源下表面检测法和上表面检测法.结果表明,采用双光源检测法时,探针作用于上下表面均可对裂纹深度进行探测.对比两种检测手段,下表面检测法更易实现.针对深度为0.5 mm~2.5 mm的缺陷检测,下表面检测法的误差最高达到25.1%,而上表面检测法的裂纹深度测量误差均在2.5%以内,检测精度更高.

     

    Abstract: In depth detection of surface cracks, this paper uses numerical simulation methods to compare the surface detection method and upper surface detection method of dual-source. The results show that the probe acts on the upper and lower surfaces can be detected on the upper and lower surfaces. Comparing the two detection methods, the lower surface detection method is easier to implement. For defect detection of 0.5 mm to 2.5 mm, the lower surface detection method has a maximum of 25.1%, while the upper surface detection method has a crack depth measurement error within 2.5%, In contract, the detection accuracy is higher.

     

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