Research on Damage Source Localization by Acoustic Emission in High Noise Environments
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Graphical Abstract
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Abstract
In the traditional TOA acoustic emission source localization technology, the threshold-based acoustic wave arrival time detection method will have a large error in high noise environments, which leads to the problem of low localization rate and large localization error of damage source. The relationship between TOA localization technology and noise level is studied by experimental method, and the mechanism of noise affecting the localization of acoustic emission source is analyzed. The AIC technology is used to correct the real arrival time of acoustic waves in a noisy environment, which greatly improves the localization rate and localization accuracy. The method is applied in the real fatigue test damage detection of aluminum alloy specimens, and the damage is successfully located before the artificial visible crack.
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