Abstract: In order to explore the gene locus controlling flag leaf area related traits of wheat, 215 wheat varieties or lines suitable for northern Hebei Province were used as research materials, which were planted from 2020 to 2022, respectively. The whole-genome scanning using wheat 16K high density SNP chip was conducted. Genome-wide association analysis（GWAS） was conducted based on flag leaf area related traits（flag leaf width, length and area）. The results showed that there were 23 SNPs significantly associated to flag leaf width, among which 18 SNPs on chromosomes 1A, 2B（6）, 3A, 4A, 4B, 5A, 5B（5）, 5D and 6B were detected in multiple environments. Two SNPs significantly associated with flag leaf length were not detected in multiple environments. Among the 21 SNPs significantly associated with flag leaf area, two located on chromosomes 2B and 5A were detected in multiple environments. There were 13 SNPs showing a single cause and multiple effects on chromosomes 1A, 2B（3）, 3A, 4A, 5A（2）, 5B（3）, 5D and 7A, and these SNPs were significantly associated with flag leaf area, as well as flag leaf width or length.